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BS IEC 63068-3:2020 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.99

31.080.99 Other semiconductor devices

Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Test method for defects using photoluminescence

Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Test method for defects using photoluminescence

BS IEC 63068-3:2020

Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Test method for defects using photoluminescence


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ISBN: 9780539021363

Keywords:
Tests, Testing, Integrated circuit technology, Semiconductor devices, Electronic equipment and components, PDF
Publication Date24 Jul 2020
Product SKU30382425
ISBN9780539021363
BSI CodeBS IEC 63068-3:2020
No. of pages28
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 63068-3 Ed.1.0




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