BS EN 62047-18:2013 | British Standards

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Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materials

BS EN 62047-18:2013

Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materials

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ISBN: 9780580720116

Keywords:
Semiconductor technology, Bend testing, Test specimens, Test equipment, Resonance, Integrated circuits, Semiconductor devices, Fatigue testing, Thin-film devices, Electromechanical devices, Vibration, Electronic equipment and components, PDF

Publication Date	31 Oct 2013
Product SKU	30230317
ISBN	9780580720116
BSI Code	BS EN 62047-18:2013
No. of pages	18
Publisher	British Standards Institution

Identical National Standard to:

IEC 62047-18:2013
EN 62047-18:2013

BS EN 62047-18:2013 | British Standards

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