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BS EN 62047-18:2013 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.99

31.080.99 Other semiconductor devices

Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materials

Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materials

BS EN 62047-18:2013

Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materials


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ISBN: 9780580720116

Keywords:
Semiconductor technology, Bend testing, Test specimens, Test equipment, Resonance, Integrated circuits, Semiconductor devices, Fatigue testing, Thin-film devices, Electromechanical devices, Vibration, Electronic equipment and components, PDF
Publication Date31 Oct 2013
Product SKU30230317
ISBN9780580720116
BSI CodeBS EN 62047-18:2013
No. of pages18
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 62047-18:2013
  • EN 62047-18:2013




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