BS EN 62047-8:2011 | British Standards

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Semiconductor devices. Micro-electromechanical devices Strip bending test method for tensile property measurement of thin films

BS EN 62047-8:2011

Semiconductor devices. Micro-electromechanical devices Strip bending test method for tensile property measurement of thin films

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ISBN: 9780580606298

Keywords:
Electronic equipment and components, Bend testing, Semiconductor technology, Strips, Test equipment, Tensile testing, Electromechanical devices, Test specimens, Thin films, Semiconductor devices, Integrated circuits, PDF

Publication Date	30 Jun 2011
Product SKU	30172399
ISBN	9780580606298
BSI Code	BS EN 62047-8:2011
No. of pages	22
Publisher	British Standards Institution

Identical National Standard to:

EN 62047-8:2011
IEC 62026-3:2014/COR1:2015
EN 60512-13-1:2006
IEC 62047-8:2011

BS EN 62047-8:2011 | British Standards

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