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BS IEC 62047-28:2017 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.99

31.080.99 Other semiconductor devices

Semiconductor devices. Micro-electromechanical devices Performance testing method of vibration-driven MEMS electret energy harvesting devices

Semiconductor devices. Micro-electromechanical devices Performance testing method of vibration-driven MEMS electret energy harvesting devices

BS IEC 62047-28:2017

Semiconductor devices. Micro-electromechanical devices Performance testing method of vibration-driven MEMS electret energy harvesting devices


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ISBN: 9780580901980

Keywords:
Test equipment, Test specimens, Vibration, Resonance, Bend testing, Fatigue testing, Thin-film devices, Integrating circuits, Semiconductor technology, Electromechanical devices, Electronic equipment and components, Semiconductor devices, PDF
Publication Date22 Jul 2020
Product SKU30323631
ISBN9780580901980
BSI CodeBS IEC 62047-28:2017
No. of pages20
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 62047-28:2017




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