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BS IEC 62047-44:2024 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.99

31.080.99 Other semiconductor devices

Semiconductor devices. Micro-electromechanical devices Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices

Semiconductor devices. Micro-electromechanical devices Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices

BS IEC 62047-44:2024

Semiconductor devices. Micro-electromechanical devices Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices


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ISBN: 9780539218480

Keywords:
Electric fields, Resonant frequency, Performance, Performance testing, Testing methods, Electromechanical devices, Semiconductor devices, Semiconductor technology, PDF
Publication Date29 Feb 2024
Product SKU30454363
ISBN9780539218480
BSI CodeBS IEC 62047-44:2024
No. of pages22
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 62047-44:2024




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