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BS IEC 62047-47:2024 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.99

31.080.99 Other semiconductor devices

Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of bending strength of microstructures

Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of bending strength of microstructures

BS IEC 62047-47:2024

Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of bending strength of microstructures


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ISBN: 9780539218510

Keywords:
Semiconductor materials, Electronic devices, Silicon chips, Measurement, Bending strength, Electromechanical devices, PDF
Publication Date28 Aug 2024
Product SKU30454375
ISBN9780539218510
BSI CodeBS IEC 62047-47:2024
No. of pages20
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 62047-47 Ed.1.0




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