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BS IEC 62047-40:2021 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.99

31.080.99 Other semiconductor devices

Semiconductor devices. Micro-electromechanical devices Test methods of micro-electromechanical inertial shock switch threshold

Semiconductor devices. Micro-electromechanical devices Test methods of micro-electromechanical inertial shock switch threshold

BS IEC 62047-40:2021

Semiconductor devices. Micro-electromechanical devices Test methods of micro-electromechanical inertial shock switch threshold


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ISBN: 9780539070330

Keywords:
Test methods, Semiconductor technology, Electronic equipment and components, Electromechanical devices, Semiconductor devices, Integrated circuits, PDF
Publication Date14 Sep 2021
Product SKU30405218
ISBN9780539070330
BSI CodeBS IEC 62047-40:2021
No. of pages14
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 62047-40 Ed.1.0




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