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BS IEC 63601:2026 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.99

31.080.99 Other semiconductor devices

Guideline for evaluating bias temperature instability of silicon carbide metal-oxide-semiconductor devices for power electronic conversion

Guideline for evaluating bias temperature instability of silicon carbide metal-oxide-semiconductor devices for power electronic conversion

BS IEC 63601:2026

Guideline for evaluating bias temperature instability of silicon carbide metal-oxide-semiconductor devices for power electronic conversion


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ISBN: 9780539330854

Keywords:
Temperature, Evaluation, Bias, Silicon carbide, Electronic equipment and components, Semiconductors, Metal oxide semiconductors, PDF
Publication Date10 Feb 2026
Product SKU30499100
ISBN9780539330854
BSI CodeBS IEC 63601:2026
No. of pages50
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 63601:2026




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