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BS EN 62374:2007 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.99

31.080.99 Other semiconductor devices

Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films

Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films

BS EN 62374:2007

Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films


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ISBN: 9780580540486

Keywords:
Mathematical calculations, Electrical measurement, Semiconductor devices, Testing conditions, Semiconductors, Films (states of matter), Dielectric breakdown, Life (durability), PDF
Publication Date31 Oct 2008
Product SKU30100338
ISBN9780580540486
BSI CodeBS EN 62374:2007
No. of pages24
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 62374:2007
  • EN 62374:2007




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