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BS IEC 62047-35:2019 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.99

31.080.99 Other semiconductor devices

Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics under bending deformation for flexible electromechanical devices

Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics under bending deformation for flexible electromechanical devices

BS IEC 62047-35:2019

Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics under bending deformation for flexible electromechanical devices


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ISBN: 9780580994951

Keywords:
Semiconductor technology, Electromechanical devices, Deformation, Test methods, Semiconductor devices, PDF
Publication Date20 Apr 2021
Product SKU30364444
ISBN9780580994951
BSI CodeBS IEC 62047-35:2019
No. of pages24
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 62047-35 Ed.1.0




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