Buy British Standards OnlineBuy Standards Online Worldwide Delivery AvailableBuy Downloads of British StandardsSecure Online Ordering
Start of Content

BS IEC 62047-35:2019 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.99

31.080.99 Other semiconductor devices

Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics under bending deformation for flexible electromechanical devices

Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics under bending deformation for flexible electromechanical devices

BS IEC 62047-35:2019

Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics under bending deformation for flexible electromechanical devices


Buy a printed copy from us with a 10% discount, or follow the link to purchase a PDF on the BSI website.

BSI Price (PDF/Printed): £220.00
Our Price (Printed only): £198.00



ISBN: 9780580994951

Keywords:
Semiconductor technology, Electromechanical devices, Deformation, Test methods, Semiconductor devices, PDF
Publication Date20 Apr 2021
Product SKU30364444
ISBN9780580994951
BSI CodeBS IEC 62047-35:2019
No. of pages24
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 62047-35 Ed.1.0




spacer
End of Content
Standards A-Z Subject Index
© 2016 - 2025 BuyStandardsOnline.co.uk | Sitemap | Ways To Order | Delivery Charges | Contact Us | Terms and Conditions | Official BSI Distributor | Worldwide Delivery