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BS IEC 60747-5-18:2026 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.99

31.080.99 Other semiconductor devices

Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes

Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes

BS IEC 60747-5-18:2026

Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes


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ISBN: 9780539313604

Keywords:
Semiconductor technology, Semiconductor devices, Optoelectronic devices, Light-emitting diodes, Testing methods, Luminescence, Epitaxial layers, PDF
Publication Date16 Jun 2026
Product SKU30490679
ISBN9780539313604
BSI CodeBS IEC 60747-5-18:2026
No. of pages22
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 60747-5-18 ED1




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