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British Standards for 31.080.01 Semiconductor devices in general | Module: ICS 31.080.01

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

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BS EN IEC 60191-1:2018
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of discrete devices
SKU/ISBN:9780580844256

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BS EN 62779-3:2016
Semiconductor devices. Semiconductor interface for human body communication Functional type and its operational conditions
SKU/ISBN:9780580865923

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BS EN 60749-9:2017
Semiconductor devices. Mechanical and climatic test methods Permanence of marking
SKU/ISBN:9780580949357

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BS EN IEC 60749-13:2018
Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
SKU/ISBN:9780580984228

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BS IEC 60747-18-2:2020
Semiconductor devices Semiconductor bio sensors. Evaluation process of lens-free CMOS photonic array sensor package modules
SKU/ISBN:9780580973925

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BS EN 60749-3:2017
Semiconductor devices. Mechanical and climatic test methods External visual examination
SKU/ISBN:9780580948930

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BS EN 60749-4:2017
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
SKU/ISBN:9780580942297

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BS EN IEC 60749-12:2018
Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
SKU/ISBN:9780580986826

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BS EN 60749-6:2017
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
SKU/ISBN:9780580948923

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PD IEC/TR 63133:2017
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
SKU/ISBN:9780580988516

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BS IEC 60747-14-10:2019
Semiconductor devices Semiconductor sensors. Performance evaluation methods for wearable glucose sensors
SKU/ISBN:9780580966514

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BS IEC 62779-4:2020
Semiconductor devices. Semiconductor interface for human body communication Capsule endoscope
SKU/ISBN:9780580991974

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BS IEC 62880-1:2017
Semiconductor devices. Stress migration test standard Copper stress migration test standard
SKU/ISBN:9780580858086

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BS EN IEC 60749-15:2020
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
SKU/ISBN:9780539049374

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BS EN IEC 60749-30:2020
Semiconductor devices. Mechanical and climatic test methods Preconditioning of non-hermetic surface mount devices prior to reliability testing
SKU/ISBN:9780539045833

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BS EN IEC 60749-20:2020
Semiconductor devices. Mechanical and climatic test methods Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
SKU/ISBN:9780539045840

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BS IEC 62830-5:2021
Semiconductor devices. Semiconductor devices for energy harvesting and generation Test method for measuring generated power from flexible thermoelectric devices
SKU/ISBN:9780580972898

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BS IEC 60747-14-11:2021
Semiconductor devices Semiconductor sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
SKU/ISBN:9780580989827

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BS EN IEC 60068-2-13:2021
Environmental testing Tests. Test M: Low air pressure
SKU/ISBN:9780539037104

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BS EN IEC 63287-1:2021
Semiconductor devices. Generic semiconductor qualification guidelines Guidelines for IC reliability qualification
SKU/ISBN:9780539127232

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PD IEC TR 63378-1:2021
Thermal standardization on semiconductor packages Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages
SKU/ISBN:9780539171525

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BS EN IEC 60749-39:2022
Semiconductor devices. Mechanical and climatic test methods Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
SKU/ISBN:9780539152005

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BS EN IEC 60749-28:2022
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level
SKU/ISBN:9780539136579

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BS EN IEC 60749-37:2022
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
SKU/ISBN:9780539151992

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BS EN IEC 62007-1:2015+A1:2022
Semiconductor optoelectronic devices for fibre optic system applications Specification template for essential ratings and characteristics
SKU/ISBN:9780539205282

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BS EN 61975:2010+A2:2022
High-voltage direct current (HVDC) installations. System tests
SKU/ISBN:9780539166644

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BS IEC 62951-9:2022
Semiconductor devices. Flexible and stretchable semiconductor devices Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
SKU/ISBN:9780539144376

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BS EN IEC 63364-1:2022
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
SKU/ISBN:9780539166606

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BS EN IEC 63287-2:2023
Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile
SKU/ISBN:9780539156645

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BS IEC 63229:2021
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
SKU/ISBN:9780539029208

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BS IEC 62047-37:2020
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
SKU/ISBN:9780539025330

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BS EN 60749-44:2016
Semiconductor devices. Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
SKU/ISBN:9780580862038

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BS EN 60749-40:2011
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
SKU/ISBN:9780580646294

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BS EN 60749-42:2014
Semiconductor devices. Mechanical and climatic test methods Temperature and humidity storage
SKU/ISBN:9780580790911

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BS EN 60749-35:2006
Semiconductor devices. Mechanical and climatic test methods Acoustic microscopy for plastic encapsulated electronic components
SKU/ISBN:0580497399

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BS EN 60749-25:2003
Semiconductor devices. Mechanical and climatic test methods Temperature cycling
SKU/ISBN:0580428591

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BS EN 60749-2:2002
Semiconductor devices. Mechanical and climatic test methods Low air pressure
SKU/ISBN:0580403971

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BS EN 60749-38:2008
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
SKU/ISBN:9780580548758

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BS EN 60749-8:2003
Semiconductor devices. Mechanical and climatic test methods Sealing
SKU/ISBN:0580422011

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BS EN 60749-1:2003
Semiconductor devices. Mechanical and climatic test methods General
SKU/ISBN:0580421988

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BS EN 60749-11:2002
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
SKU/ISBN:0580403955

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BS EN 60749-33:2004
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
SKU/ISBN:0580439739

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BS EN 60749-24:2004
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
SKU/ISBN:0580439720

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BS EN 60749-14:2003
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)
SKU/ISBN:0580430820

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BS EN 60749-20-1:2009
Semiconductor devices. Mechanical and climatic test methods Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
SKU/ISBN:9780580546013

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BS EN 60749-36:2003
Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state
SKU/ISBN:0580420655

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BS EN IEC 60749-41:2020
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices
SKU/ISBN:9780580962875

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BS EN 60749-16:2003
Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)
SKU/ISBN:0580420620

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BS IEC 63378-2-1:2024
Thermal standardization on semiconductor packages 3D thermal simulation models of semiconductor packages for steady-state analysis. Discrete packages
SKU/ISBN:9780539258998

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BS IEC 60747-5-4:2022+A1:2024
Semiconductor devices Optoelectronic devices. Semiconductor lasers
SKU/ISBN:9780539268775

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Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

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