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British Standards for 31.080.01 Semiconductor devices in general | Module: ICS 31.080.01

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

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BS EN IEC 63378-3:2025
Thermal standardization on semiconductor packages Thermal circuit simulation models of discrete semiconductor packages for transient analysis
SKU/ISBN:9780539191639

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BS EN IEC 60749-34-1:2025
Semiconductor devices. Mechanical and climatic test methods Power cycling test for power semiconductor module
SKU/ISBN:9780539193237

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BS EN IEC 60749-10:2022
Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
SKU/ISBN:9780539173451

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BS EN IEC 60749-5:2024
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
SKU/ISBN:9780539232165

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BS EN IEC 60747-5-5:2020
Semiconductor devices Optoelectronic devices. Photocouplers
SKU/ISBN:9780580961816

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BS IEC 60191-2:1966+A21:2020
Mechanical standardization of semiconductor devices Dimensions
SKU/ISBN:9780580911866

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BS EN IEC 60749-22-1:2026
Semiconductor devices — Mechanical and climatic test methods Bond strength — wire bond pull test methods
SKU/ISBN:9780539340389

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BS EN IEC 60749-7:2026
Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases
SKU/ISBN:9780539327373

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BS EN IEC 60749-24:2026
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
SKU/ISBN:9780539327403

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Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

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