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British Standards for 71.040.40 Chemical analysis | Module: ICS 71.040.40

Standards Shop | ICS 71 | ICS 71.040 |  ICS 71.040.40

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BS 5443:1977
Recommendations for a standard layout for methods of chemical analysis by gas chromatography
SKU/ISBN:0580391493

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BS 6337-1:1983
General methods of chemical analysis Method for determination of traces of sulphur compounds by reduction and titrimetry
SKU/ISBN:0580131505

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BS 6337-2:1983
General methods of chemical analysis Method for determination of silicon content (reduced molybdosilicate spectrophotometric method)
SKU/ISBN:0580131513

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BS 6337-3:1983
General methods of chemical analysis Method for determination of iron content (1,10-phenanthroline spectrophotometric method)
SKU/ISBN:0580131521

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BS 6337-4:1984
General methods of chemical analysis Method for determination of chloride ions by potentiometry
SKU/ISBN:0580136612

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BS 2511:1970
Methods for the determination of water (Karl Fischer method)
SKU/ISBN:0580056384

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BS ISO 17974:2002
Surface chemical analysis. High-resolution Auger electron spectrometers. Calibration of energy scales for elemental and chemical-state analysis
SKU/ISBN:0580408485

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BS ISO 20341:2003
Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials
SKU/ISBN:0580424391

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BS ISO 21270:2004
Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
SKU/ISBN:0580457087

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PD ISO/TR 22335:2007
Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer
SKU/ISBN:9780580540141

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BS ISO 22048:2004
Surface chemical analysis. Information format for static secondary-ion mass spectrometry
SKU/ISBN:058045715X

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BS EN ISO 14912:2006
Gas analysis. Conversion of gas mixture composition data
SKU/ISBN:9780580678509

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BS ISO 23812:2009
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials
SKU/ISBN:9780580557651

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BS ISO 23830:2008
Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
SKU/ISBN:9780580557668

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BS ISO 14237:2010
Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials
SKU/ISBN:9780580574023

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BS EN ISO 6144:2006
Gas analysis. Preparation of calibration gas mixtures. Static volumetric method
SKU/ISBN:0580414698

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BS EN ISO 6143:2006
Gas analysis. Comparison methods for determining and checking the composition of calibration gas mixtures
SKU/ISBN:0580380688

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BS EN ISO 6145-4:2008
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Continuous syringe injection method
SKU/ISBN:9780580603594

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BS EN ISO 6145-8:2008
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Diffusion method
SKU/ISBN:9780580603617

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BS EN ISO 6145-10:2008
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Permeation method
SKU/ISBN:9780580603624

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BS EN ISO 6145-11:2008
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Electrochemical generation
SKU/ISBN:9780580603631

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BS ISO 17331:2004+A1:2010
Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
SKU/ISBN:9780580644795

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BS EN ISO 15796:2008
Gas analysis. Investigation and treatment of analytical bias
SKU/ISBN:9780580650147

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BS ISO 12406:2010
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
SKU/ISBN:9780580668746

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BS ISO 16242:2011
Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES)
SKU/ISBN:9780580668753

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BS ISO 16243:2011
Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
SKU/ISBN:9780580668760

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BS ISO 11039:2012
Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
SKU/ISBN:9780580668784

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BS ISO 13095:2014
Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
SKU/ISBN:9780580677526

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BS ISO 13424:2013
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
SKU/ISBN:9780580683947

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BS EN ISO 10723:2012
Natural gas. Performance evaluation for analytical systems
SKU/ISBN:9780580699443

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BS ISO 6145-2:2014
Gas analysis. Preparation of calibration gas mixtures using dynamic methods Piston pumps
SKU/ISBN:9780580700811

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PD ISO/TR 19319:2013
Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
SKU/ISBN:9780580711862

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BS EN ISO 6145-5:2010
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Capillary calibration devices
SKU/ISBN:9780580722042

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BS EN ISO 6145-9:2010
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Saturation method
SKU/ISBN:9780580722066

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BS ISO 11505:2012
Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
SKU/ISBN:9780580770852

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BS ISO 14706:2014
Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
SKU/ISBN:9780580827259

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BS ISO 17560:2014
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
SKU/ISBN:9780580856365

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BS ISO 24237:2005
Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
SKU/ISBN:0580462803

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BS ISO 24236:2005
Surface chemical analysis. Auger electron spectroscopy. Repeatability and constancy of intensity scale
SKU/ISBN:0580459675

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BS ISO 18516:2006
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution
SKU/ISBN:0580496104

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PD IEC/TR 62456:2007
An electrochemical reference system for use in different solvent media. The decamethylated ferricinium/ferrocene redox couple
SKU/ISBN:9780580508554

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BS EN ISO 21079-1:2008
Chemical analysis of refractories containing alumina, zirconia and silica. Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) Apparatus, reagents and dissolution
SKU/ISBN:9780580585708

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BS EN ISO 21079-2:2008
Chemical analysis of refractories containing alumina, zirconia, and silica. Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) Wet chemical analysis
SKU/ISBN:9780580585715

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BS EN ISO 21079-3:2008
Chemical analysis of refractories containing alumina, zirconia, and silica. Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) Flame atomic absorption spectrophotometry (FAAS) and inductively c..
SKU/ISBN:9780580585722

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BS ISO 27911:2011
Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
SKU/ISBN:9780580588280

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DD ISO/TS 29041:2008
Gas mixtures. Gravimetric preparation. Mastering correlations in composition
SKU/ISBN:9780580619755

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BS ISO 29081:2010
Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
SKU/ISBN:9780580634789

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BS ISO 11775:2015
Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
SKU/ISBN:9780580668715

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BS ISO 28600:2011
Surface chemical analysis. Data transfer format for scanning-probe microscopy
SKU/ISBN:9780580668777

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BS ISO 13083:2015
Surface chemical analysis. Scanning probe microscopy. Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
SKU/ISBN:9780580677519

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BS EN ISO 6142-1:2015
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class I mixtures
SKU/ISBN:9780580762734

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BS ISO 7504:2015
Gas analysis. Vocabulary
SKU/ISBN:9780580771408

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BS ISO 18337:2015
Surface chemical analysis. Surface characterization. Measurement of the lateral resolution of a confocal fluorescence microscope
SKU/ISBN:9780580811326

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BS ISO 19830:2015
Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
SKU/ISBN:9780580865190

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BS EN 50436-3:2016
Alcohol interlocks. Test methods and performance requirements Guidance for authorities, decision makers, purchasers and users
SKU/ISBN:9780580906442

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BS EN 50436-7:2016
Alcohol interlocks. Test methods and performance requirements Installation document
SKU/ISBN:9780580918551

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BS EN 50271:2018
Electrical apparatus for the detection and measurement of combustible gases, toxic gases or oxygen. Requirements and tests for apparatus using software and/or digital technologies
SKU/ISBN:9780580919602

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BS ISO 17973:2016
Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
SKU/ISBN:9780580941108

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BS ISO 15471:2016
Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
SKU/ISBN:9780580941115

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BS EN 16640:2017
Bio-based products. Bio-based carbon content. Determination of the bio-based carbon content using the radiocarbon method
SKU/ISBN:9780580994777

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BS EN 62703:2013
Expression of performance of fluorometric oxygen analyzers in liquid media
SKU/ISBN:9780580788154

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BS ISO 18554:2016
Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
SKU/ISBN:9780580826191

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BS EN 61207-7:2013
Expression of performance of gas analyzers Tuneable semiconductor laser gas analyzers
SKU/ISBN:9780580909467

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BS ISO 15470:2017
Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
SKU/ISBN:9780580952333

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PD ISO/TR 18394:2016
Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
SKU/ISBN:9780580853517

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BS EN ISO 6145-1:2019
Gas analysis. Preparation of calibration gas mixtures using dynamic methods General aspects
SKU/ISBN:9780580999307

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BS EN 16785-1:2015
Bio-based products. Bio-based content Determination of the bio-based content using the radiocarbon analysis and elemental analysis
SKU/ISBN:9780580873386

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BS EN 16785-2:2018
Bio-based products. Bio-based content Determination of the bio-based content using the material balance method
SKU/ISBN:9780580895456

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BS EN 50436-6:2015
Alcohol interlocks. Test methods and performance requirements Data security
SKU/ISBN:9780580818509

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BS EN 61207-6:2015
Expression of performance of gas analyzers Photometric analyzers
SKU/ISBN:9780580830624

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BS ISO 16962:2017
Surface chemical analysis. Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
SKU/ISBN:9780580868887

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BS EN 17256:2019
Animal feeding stuffs: Methods of sampling and analysis. Determination of ergot alkaloids and tropane alkaloids in feed materials and compound feeds by LC-MS/MS
SKU/ISBN:9780580917998

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BS ISO 20289:2018
Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
SKU/ISBN:9780580894213

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PD ISO/TS 25138:2019
Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry
SKU/ISBN:9780539061345

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BS ISO 20903:2019
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
SKU/ISBN:9780580519482

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BS EN ISO 6145-7:2018
Gas analysis. Preparation of calibration gas mixtures using dynamic methods Thermal mass-flow controllers
SKU/ISBN:9780580511707

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BS ISO 16129:2018
Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
SKU/ISBN:9780580519505

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BS ISO 19229:2019
Gas analysis. Purity analysis and the treatment of purity data
SKU/ISBN:9780580963070

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BS ISO 20411:2018
Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
SKU/ISBN:9780580898808

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BS ISO 14701:2018
Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
SKU/ISBN:9780580519499

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BS ISO 14167:2018
Gas analysis. General quality aspects and metrological traceability of calibration gas mixtures
SKU/ISBN:9.78058E+12

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BS EN ISO 6145-6:2017
Gas analysis. Preparation of calibration gas mixtures using dynamic methods Critical flow orifices
SKU/ISBN:9780580795725

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BS ISO 13084:2018
Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
SKU/ISBN:9.78058E+12

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BS ISO 20579-4:2018
Surface chemical analysis. Guidelines to sample handling, preparation and mounting Reporting information related to the history, preparation, handling and mounting of nano-objects prior to surface analysis
SKU/ISBN:9780580906336

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PD ISO/TS 18507:2015
Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
SKU/ISBN:9780580815430

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PD ISO/TR 19693:2018
Surface chemical analysis. Characterization of functional glass substrates for biosensing applications
SKU/ISBN:9780580869457

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BS ISO 19668:2017
Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials
SKU/ISBN:9.78058E+12

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BS ISO 22415:2019
Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
SKU/ISBN:9.78058E+12

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BS EN ISO 16664:2017
Gas analysis. Handling of calibration gases and gas mixtures. Guidelines
SKU/ISBN:9.78058E+12

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BS ISO 11952:2019
Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
SKU/ISBN:9780580882968

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BS ISO 21222:2020
Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
SKU/ISBN:9.78058E+12

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BS EN 50980-1:2019
Remote alcohol monitoring devices. Test methods and performance requirements Instruments for assessment programmes
SKU/ISBN:9780539022865

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BS ISO 10810:2019
Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
SKU/ISBN:9780580510465

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BS EN ISO 6141:2015+A1:2020
Gas analysis. Contents of certificates for calibration gas mixtures
SKU/ISBN:9780580523403

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PD ISO/TS 15338:2020
Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures
SKU/ISBN:9.78058E+12

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PD ISO/TR 14187:2020
Surface chemical analysis. Characterization of nanostructured materials
SKU/ISBN:9780539019360

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BS ISO 16413:2020
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
SKU/ISBN:9780539016529

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BS ISO 16531:2020
Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
SKU/ISBN:9780539057850

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BS ISO 19230:2020
Gas analysis. Sampling guidelines
SKU/ISBN:9.78058E+12

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BS ISO 12963:2017+A1:2020
Gas analysis. Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
SKU/ISBN:9780539138238

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BS ISO 14707:2021
Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
SKU/ISBN:9780539153637

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BS ISO 22581:2021
Surface chemical analysis. Near real-time information from the X-ray photoelectron spectroscopy survey scan. Rules for identification of, and correction for, surface contamination by carbon-containing compounds
SKU/ISBN:9780580994302

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PD ISO/TR 15969:2021
Surface chemical analysis. Depth profiling. Measurement of sputtered depth
SKU/ISBN:9780539154320

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BS ISO 18114:2021
Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials
SKU/ISBN:9780539126808

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BS ISO 19318:2021
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
SKU/ISBN:9780539145342

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PD CEN/TR 17674:2021
Bio-based products. Use of stable isotope ratios of Carbon, Hydrogen, Oxygen and Nitrogen as tools for verification of the origin of bio-based feedstock and characteristics of production processes. Overview of relevant existing applications
SKU/ISBN:9780539145090

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BS ISO 18115-2:2021
Surface chemical analysis. Vocabulary Terms used in scanning-probe microscopy
SKU/ISBN:9780539181982

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BS ISO 17109:2022
Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin films..
SKU/ISBN:9780539191257

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BS ISO 23729:2022
Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
SKU/ISBN:9780539129939

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BS ISO 23170:2022
Surface chemical analysis. Depth profiling. Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
SKU/ISBN:9780539144734

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BS ISO 24417:2022
Surface chemical analysis. Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
SKU/ISBN:9780539120431

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BS ISO 17862:2022
Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
SKU/ISBN:9780539127034

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BS ISO 6142-1:2015+A1:2020
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class I mixtures
SKU/ISBN:9780539138245

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BS ISO 24465:2023
Surface chemical analysis. Determination of the minimum detectability of surface plasmon resonance device
SKU/ISBN:9780539068337

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BS ISO 14606:2022
Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
SKU/ISBN:9780539183597

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BS ISO 18115-1:2023
Surface chemical analysis. Vocabulary General terms and terms used in spectroscopy
SKU/ISBN:9780539168921

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BS EN 17813:2023
Environmental solid matrices. Determination of halogens and sulfur by oxidative pyrohydrolytic combustion followed by ion chromatography
SKU/ISBN:9780539195460

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BS ISO 7431-2:2024
Thiourea for industrial use Specifications
SKU/ISBN:9780539232295

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BS ISO 7431-1:2024
Thiourea for industrial use Test methods
SKU/ISBN:9780539232288

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BS ISO 6142-2:2024
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class II mixtures
SKU/ISBN:9780539181388

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BS ISO 18118:2024
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
SKU/ISBN:9780539236279

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