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BS ISO 14237:2010 | British Standards

Standards Shop | ICS 71 | ICS 71.040 |  ICS 71.040.40

71.040.40 Chemical analysis

Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials

Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials

BS ISO 14237:2010

Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials


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ISBN: 9780580574023

Keywords:
Surface properties, Ions, Specimen preparation, Concentration (chemical), Single, Control samples, Calibration, Doping agents, Secondary, Determination of content, Boron, Silicon, Isotopes, Homogeneity, Surface chemistry, Mathematical calculations, Performance testing, Semiconductor technology, Chemical analysis and testing, Statistical methods of analysis, Mass spectrometry, Spectroscopy, Crystal, PDF
Publication Date31 Aug 2010
Product SKU30153671
ISBN9780580574023
BSI CodeBS ISO 14237:2010
No. of pages30
ReplacesBS ISO 14237:2000
PublisherBritish Standards Institution
Identical National Standard to:
  • ISO 14237:2010




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