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BS ISO 14701:2018 | British Standards

Standards Shop | ICS 71 | ICS 71.040 |  ICS 71.040.40

71.040.40 Chemical analysis

Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness

Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness

BS ISO 14701:2018

Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness


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ISBN: 9780580519499

Keywords:
Spectroscopy, Thickness measurement, Photoelectron spectroscopy, X-ray photoelectron spectroscopy, Surface chemistry, Silicon, Chemical analysis and testing, Surface properties, Oxides, Electron emission, PDF
Publication Date05 Nov 2018
Product SKU30368967
ISBN9780580519499
BSI CodeBS ISO 14701:2018
No. of pages26
ReplacesBS ISO 14701:2011
PublisherBritish Standards Institution
Identical National Standard to:
  • ISO 14701:2018




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