Tracked Changes. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
BS ISO 18118:2024 - TC
Tracked Changes. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
This is a Tracked Changes version
Tracked Changes is a version of a standard that indicates a change has been made, during the standards revision process, between the active standard and its previous version. Additions, deletions, and other formatting and/or content revisions are clearly displayed as underlined and strike through texts, ensuring all changes made between the two documents are quickly and easily identified
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ISBN: 9780539309515
Keywords:
Experimental data, Auger electron spectroscopy, X-ray photoelectron spectroscopy, Chemical analysis and testing, Chemical composition, Photoelectron spectroscopy, Spectroscopy, Homogeneity, Sensitivity, Surface chemistry, Quantitative analysis, Electron emission, PDF
| Publication Date | 08 Mar 2024 |
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| Product SKU | 30488687 |
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| ISBN | 9780539309515 |
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| BSI Code | BS ISO 18118:2024 - TC |
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| No. of pages | 76 |
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| Replaces | BS ISO 18118:2015 - TC |
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| Category | Tracked |
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| Publisher | British Standards Institution |
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