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BS ISO 14606:2022 | British Standards

Standards Shop | ICS 71 | ICS 71.040 |  ICS 71.040.40

71.040.40 Chemical analysis

Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials

Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials

BS ISO 14606:2022

Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials


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ISBN: 9780539183597

Keywords:
X-ray photoelectron spectroscopy, Photoelectron spectroscopy, X-rays, Spectroscopy, Depth, Chemical analysis and testing, PDF
Publication Date15 Feb 2023
Product SKU30440165
ISBN9780539183597
BSI CodeBS ISO 14606:2022
No. of pages26
ReplacesBS ISO 14606:2015
PublisherBritish Standards Institution
Identical National Standard to:
  • ISO 14606:2022




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