Buy British Standards OnlineBuy Standards Online Worldwide Delivery AvailableBuy Downloads of British StandardsSecure Online Ordering
Start of Content

BS ISO 20341:2003 | British Standards

Standards Shop | ICS 71 | ICS 71.040 |  ICS 71.040.40

71.040.40 Chemical analysis

Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials

Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials

BS ISO 20341:2003

Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials


Buy a printed copy from us with a 10% discount, or follow the link to purchase a PDF on the BSI website.

BSI Price (PDF/Printed): £120.00
Our Price (Printed only): £108.00



ISBN: 0580424391

Keywords:
Mass spectrometry, Statistical methods of analysis, Spectroscopy, Normal distribution, Surface chemistry, Chemical analysis and testing, Damping coefficient, Depth measurement, Surface properties, Test methods, Mathematical calculations, Secondary, Ions, Depth, PDF
Publication Date08 Aug 2003
Product SKU30079011
ISBN0580424391
BSI CodeBS ISO 20341:2003
No. of pages14
PublisherBritish Standards Institution
Identical National Standard to:
  • ISO 20341:2003




spacer
End of Content
Standards A-Z Subject Index
© 2016 - 2024 BuyStandardsOnline.co.uk | Sitemap | Ways To Order | Delivery Charges | Contact Us | Terms and Conditions | Official BSI Distributor | Worldwide Delivery