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BS ISO 17331:2004+A1:2010 | British Standards

Standards Shop | ICS 71 | ICS 71.040 |  ICS 71.040.40

71.040.40 Chemical analysis

Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy

Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy

BS ISO 17331:2004+A1:2010

Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy


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ISBN: 9780580644795

Keywords:
Chemical analysis and testing, Surface chemistry, Silicon, Iron, X-ray fluorescence spectrometry, Control samples, Decomposition reactions, Fluorimetry, Spectrophotometry, Substrates (insulating), Nickel, Spectroscopy, PDF
Publication Date30 Sep 2010
Product SKU30189524
ISBN9780580644795
BSI CodeBS ISO 17331:2004+A1:2010
No. of pages28
AmendsBS ISO 17331:2004
PublisherBritish Standards Institution
Identical National Standard to:
  • ISO 17331:2004/AMD 1:2010




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