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BS ISO 23170:2022 | British Standards

Standards Shop | ICS 71 | ICS 71.040 |  ICS 71.040.40

71.040.40 Chemical analysis

Surface chemical analysis. Depth profiling. Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering

Surface chemical analysis. Depth profiling. Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering

BS ISO 23170:2022

Surface chemical analysis. Depth profiling. Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering


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ISBN: 9780539144734

Keywords:
Control surfaces, Testing, Chemical methods of analysis, Chemical tests, Laboratories (chemical), Reactions (chemical), PDF
Publication Date03 Aug 2022
Product SKU30423417
ISBN9780539144734
BSI CodeBS ISO 23170:2022
No. of pages38
PublisherBritish Standards Institution
Identical National Standard to:
  • ISO 23170




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