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British Standards for 31.080.30 Transistors | Module: ICS 31.080.30

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.30

BS QC 750114:1996
Harmonized system of quality assessment for electronic components. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for case-rated field-effect transistors for switching applications
SKU/ISBN:0580265005

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BSI Price (PDF/Printed): £150.00
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BS EN 120003:1993
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays
SKU/ISBN:0580356035

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BSI Price (PDF/Printed): £150.00
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BS EN 120004:1993
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Ambient rated photocouplers with phototransistor output
SKU/ISBN:0580341402

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BSI Price (PDF/Printed): £208.00
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BS EN 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
SKU/ISBN:0580492559

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BS IEC 60747-8-4:2004
Discrete semiconductor devices Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications
SKU/ISBN:0580447294

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BSI Price (PDF/Printed): £276.00
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BS EN 62416:2010
Semiconductor devices. Hot carrier test on MOS transistors
SKU/ISBN:9780580586217

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BSI Price (PDF/Printed): £120.00
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BS EN 62417:2010
Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
SKU/ISBN:9780580586224

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BSI Price (PDF/Printed): £126.00
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BS QC 750106:1993
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications
SKU/ISBN:0580341631

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BS IEC 60747-7:2010+A1:2019
Semiconductor devices. Discrete devices Bipolar transistors
SKU/ISBN:9780539003055

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BSI Price (PDF/Printed): £332.00
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BS IEC 60747-8:2010+A1:2021
Semiconductor devices. Discrete devices Field-effect transistors
SKU/ISBN:9780539035803

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BSI Price (PDF/Printed): £314.00
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BS IEC 62899-503-3:2021
Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method
SKU/ISBN:9780539043259

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BS IEC 63275-1:2022
Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors Test method for bias temperature instability
SKU/ISBN:9780539121261

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BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
SKU/ISBN:9780539126433

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BS IEC 62373-1:2020
Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Fast BTI test for MOSFET
SKU/ISBN:9780580513732

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BSI Price (PDF/Printed): £208.00
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Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.30

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