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BS IEC 63284:2022 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.30

31.080.30 Transistors

Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors

Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors

BS IEC 63284:2022

Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors


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ISBN: 9780539126433

Keywords:
Testing methods, Metal oxide semiconductors, Semiconductors, Electronic equipment and components, Semiconductor devices, PDF
Publication Date11 Nov 2022
Product SKU30409286
ISBN9780539126433
BSI CodeBS IEC 63284:2022
No. of pages16
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 63284 Ed.1.0
  • EN 63284 Ed.1.0




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