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BS IEC 62373-1:2020 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.30

31.080.30 Transistors

Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Fast BTI test for MOSFET

Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Fast BTI test for MOSFET

BS IEC 62373-1:2020

Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Fast BTI test for MOSFET


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ISBN: 9780580513732

Keywords:
Transistors, Metal oxide semiconductors, Electronic equipment and components, Temperature, Semiconductors, Voltage measurement, Semiconductor devices, Testing conditions, PDF
Publication Date30 Mar 2023
Product SKU30366376
ISBN9780580513732
BSI CodeBS IEC 62373-1:2020
No. of pages26
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 62373-1 Ed.1.0




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