Please select which cookies to accept

Necessary cookies are required for the site to function and cannot be deselected. You can find details of these on our Cookies page

Analytics cookies enable us to analyse our site usage. Marketing cookies allow us to measure the effectiveness of our marketing efforts.

Necessary Cookies
Analytics Cookies
Marketing Cookies
Buy British Standards OnlineBuy Standards Online Worldwide Delivery AvailableBuy Downloads of British StandardsSecure Online Ordering
Start of Content

BS EN 62417:2010 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.30

31.080.30 Transistors

Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

BS EN 62417:2010

Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)


Buy from us with a 10% discount on standard BSI prices. PDF and printed formats are available.
You can choose which format you require once the item has been added to the shopping cart.

Our Price: £127.80
Normal BSI Price: £142.00





ISBN: 9780580586224

Keywords:
Transistors, Metals, Semiconductor devices, Thermal testing, Ions, Semiconductors, Field-effect transistors, Migration (chemical), Electrical measurement, Oxides, PDF
Publication Date30 Jun 2010
Product SKU30163753
ISBN9780580586224
BSI CodeBS EN 62417:2010
No. of pages12
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 62417:2010
  • EN 61192-1:2003
  • IEC 62417:2010




spacer
End of Content
Standards A-Z Subject Index
© 2016 - 2026 BuyStandardsOnline.co.uk | Sitemap | Ways To Order | Delivery Charges | Contact Us | Terms and Conditions | Official BSI Distributor | Worldwide Delivery