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BS EN 62416:2010 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.30

31.080.30 Transistors

Semiconductor devices. Hot carrier test on MOS transistors

Semiconductor devices. Hot carrier test on MOS transistors

BS EN 62416:2010

Semiconductor devices. Hot carrier test on MOS transistors


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ISBN: 9780580586217

Keywords:
Semiconductor devices, Metal oxide semiconductors, Endurance testing, Electrical testing, Stress, Semiconductors, Transistors, Life (durability), PDF
Publication Date31 Jul 2010
Product SKU30163749
ISBN9780580586217
BSI CodeBS EN 62416:2010
No. of pages14
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 62416:2010
  • IEC 62416:2010




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