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British Standards for 31.140 Piezoelectric devices | Module: ICS 31.140

Standards Shop | ICS 31 |  ICS 31.140

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BS EN 61338-1-5:2015
Waveguide type dielectric resonators General information and test conditions. Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
SKU/ISBN:9780580829055

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BS EN 62276:2016
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
SKU/ISBN:9780580892226

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BS EN 61240:2017
Piezoelectric devices. Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection. General rules
SKU/ISBN:9780580901409

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BS EN IEC 62884-3:2018
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Frequency aging test methods
SKU/ISBN:9780580932380

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BS IEC 62047-33:2019
Semiconductor devices. Micro-electromechanical devices MEMS piezoresistive pressure-sensitive device
SKU/ISBN:9780580973901

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BS IEC 62047-34:2019
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
SKU/ISBN:9780580973918

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BS IEC 62047-30:2017
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
SKU/ISBN:9780580935787

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BS EN 60679-1:2017
Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
SKU/ISBN:9780580828416

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BS IEC 62047-36:2019
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
SKU/ISBN:9780580991189

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BS EN 60122-1:2002+A1:2018
Quartz crystal units of assessed quality Generic specification
SKU/ISBN:9780580812699

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BS EN IEC 60122-4:2019
Quartz crystal units of assessed quality Crystal units with thermistors
SKU/ISBN:9780580979743

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BS EN 62575-1:2016
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality Generic specification
SKU/ISBN:9780580778599

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BS EN 62884-2:2017
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Phase jitter measurement method
SKU/ISBN:9780580953453

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BS EN IEC 62884-4:2019
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Short-term frequency stability test methods
SKU/ISBN:9780580932397

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BS EN 62884-1:2017
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement
SKU/ISBN:9780580905544

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BS EN IEC 63041-2:2018
Piezoelectric sensors Chemical and biochemical sensors
SKU/ISBN:9780580934063

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BS EN 60444-8:2017
Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units
SKU/ISBN:9780580831140

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BS EN IEC 63155:2020
Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications
SKU/ISBN:9780580513756

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BS EN IEC 63041-3:2020
Piezoelectric sensors Physical sensors
SKU/ISBN:9780580994937

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BS EN IEC 60444-6:2021
Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD)
SKU/ISBN:9780539121346

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BS EN IEC 63041-1:2021
Piezoelectric sensors Generic specifications
SKU/ISBN:9780539070392

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BS EN IEC 62604-2:2022
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Guidelines for the use
SKU/ISBN:9780539122152

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BS EN IEC 62604-1:2022
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
SKU/ISBN:9780539122145

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BS EN IEC 62276:2025
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
SKU/ISBN:9780539257601

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BS EN IEC 60122-2:2025
Quartz crystal units of assessed quality Guidelines for the use
SKU/ISBN:9780539267563

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Standards Shop | ICS 31 |  ICS 31.140

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