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BS EN IEC 62276:2025 - TC | British Standards

Standards Shop | ICS 31 |  ICS 31.140

31.140 Piezoelectric devices

Tracked Changes. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods

Tracked Changes. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods

BS EN IEC 62276:2025 - TC

Tracked Changes. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods

This is a Tracked Changes version
Tracked Changes is a version of a standard that indicates a change has been made, during the standards revision process, between the active standard and its previous version. Additions, deletions, and other formatting and/or content revisions are clearly displayed as underlined and strike through texts, ensuring all changes made between the two documents are quickly and easily identified




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ISBN: 9780539370348

Keywords:
Acoustic filters, Crystal resonators, Acoustic waves, Crystals (electronic), Electrical wave measurement, Acoustoelectric devices, Electromechanical filters, Piezoelectric devices, Acoustic measurement, Quartz, Dielectric devices, Substrates (insulating), PDF
Publication Date15 May 2025
Product SKU30516130
ISBN9780539370348
BSI CodeBS EN IEC 62276:2025 - TC
No. of pages116
CategoryTracked
PublisherBritish Standards Institution




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