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BS IEC 62047-30:2017 | British Standards

Standards Shop | ICS 31 |  ICS 31.140

31.140 Piezoelectric devices

Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film

Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film

BS IEC 62047-30:2017

Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film


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ISBN: 9780580935787

Keywords:
Thin-film circuits, Integrated circuit manufacture, Semiconductor technology, Electromechanical devices, Electronic equipment and components, Semiconductor devices, PDF
Publication Date09 Oct 2017
Product SKU30338637
ISBN9780580935787
BSI CodeBS IEC 62047-30:2017
No. of pages24
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 62047-30:2017




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