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BS IEC 62047-36:2019 | British Standards

Standards Shop | ICS 31 |  ICS 31.140

31.140 Piezoelectric devices

Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films

Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films

BS IEC 62047-36:2019

Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films


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ISBN: 9780580991189

Keywords:
Terminology, Electronic equipment and components, Electromechanical devices, Semiconductor technology, Integrated circuits, Semiconductor devices, Vocabulary, PDF
Publication Date24 Apr 2019
Product SKU30363045
ISBN9780580991189
BSI CodeBS IEC 62047-36:2019
No. of pages20
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 62047-36:2019
  • ERROR




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