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British Standards for 71.040.40 Chemical analysis | Module: ICS 71.040.40

Standards Shop | ICS 71 | ICS 71.040 |  ICS 71.040.40

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BS 5443:1977
Recommendations for a standard layout for methods of chemical analysis by gas chromatography
SKU/ISBN:0580391493

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BS 6337-1:1983
General methods of chemical analysis Method for determination of traces of sulphur compounds by reduction and titrimetry
SKU/ISBN:0580131505

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BS 6337-2:1983
General methods of chemical analysis Method for determination of silicon content (reduced molybdosilicate spectrophotometric method)
SKU/ISBN:0580131513

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BS 6337-3:1983
General methods of chemical analysis Method for determination of iron content (1,10-phenanthroline spectrophotometric method)
SKU/ISBN:0580131521

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BS 6337-4:1984
General methods of chemical analysis Method for determination of chloride ions by potentiometry
SKU/ISBN:0580136612

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BS 2511:1970
Methods for the determination of water (Karl Fischer method)
SKU/ISBN:0580056384

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BS ISO 17974:2002
Surface chemical analysis. High-resolution Auger electron spectrometers. Calibration of energy scales for elemental and chemical-state analysis
SKU/ISBN:0580408485

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BS ISO 20341:2003
Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials
SKU/ISBN:0580424391

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BS ISO 21270:2004
Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
SKU/ISBN:0580457087

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PD ISO/TR 22335:2007
Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer
SKU/ISBN:9780580540141

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BS ISO 22048:2004
Surface chemical analysis. Information format for static secondary-ion mass spectrometry
SKU/ISBN:058045715X

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BS EN ISO 14912:2006
Gas analysis. Conversion of gas mixture composition data
SKU/ISBN:9780580678509

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BS ISO 23812:2009
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials
SKU/ISBN:9780580557651

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BS ISO 23830:2008
Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
SKU/ISBN:9780580557668

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BS ISO 14237:2010
Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials
SKU/ISBN:9780580574023

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BS EN ISO 6144:2006
Gas analysis. Preparation of calibration gas mixtures. Static volumetric method
SKU/ISBN:0580414698

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BS EN ISO 6143:2006
Gas analysis. Comparison methods for determining and checking the composition of calibration gas mixtures
SKU/ISBN:0580380688

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BS EN ISO 6145-4:2008
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Continuous syringe injection method
SKU/ISBN:9780580603594

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BS EN ISO 6145-8:2008
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Diffusion method
SKU/ISBN:9780580603617

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BS EN ISO 6145-10:2008
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Permeation method
SKU/ISBN:9780580603624

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BS EN ISO 6145-11:2008
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Electrochemical generation
SKU/ISBN:9780580603631

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BS ISO 17331:2004+A1:2010
Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
SKU/ISBN:9780580644795

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BS EN ISO 15796:2008
Gas analysis. Investigation and treatment of analytical bias
SKU/ISBN:9780580650147

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BS ISO 12406:2010
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
SKU/ISBN:9780580668746

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BS ISO 16242:2011
Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES)
SKU/ISBN:9780580668753

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BS ISO 16243:2011
Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
SKU/ISBN:9780580668760

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BS ISO 11039:2012
Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
SKU/ISBN:9780580668784

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BS ISO 13095:2014
Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
SKU/ISBN:9780580677526

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BS ISO 13424:2013
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
SKU/ISBN:9780580683947

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BS EN ISO 10723:2012
Natural gas. Performance evaluation for analytical systems
SKU/ISBN:9780580699443

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BS ISO 6145-2:2014
Gas analysis. Preparation of calibration gas mixtures using dynamic methods Piston pumps
SKU/ISBN:9780580700811

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PD ISO/TR 19319:2013
Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
SKU/ISBN:9780580711862

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BS EN ISO 6145-5:2010
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Capillary calibration devices
SKU/ISBN:9780580722042

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BS EN ISO 6145-9:2010
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Saturation method
SKU/ISBN:9780580722066

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BS ISO 11505:2012
Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
SKU/ISBN:9780580770852

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BS ISO 14706:2014
Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
SKU/ISBN:9780580827259

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BS ISO 17560:2014
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
SKU/ISBN:9780580856365

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BS ISO 24237:2005
Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
SKU/ISBN:0580462803

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BS ISO 24236:2005
Surface chemical analysis. Auger electron spectroscopy. Repeatability and constancy of intensity scale
SKU/ISBN:0580459675

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BS ISO 18516:2006
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution
SKU/ISBN:0580496104

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PD IEC/TR 62456:2007
An electrochemical reference system for use in different solvent media. The decamethylated ferricinium/ferrocene redox couple
SKU/ISBN:9780580508554

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BS EN ISO 21079-1:2008
Chemical analysis of refractories containing alumina, zirconia and silica. Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) Apparatus, reagents and dissolution
SKU/ISBN:9780580585708

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BS EN ISO 21079-2:2008
Chemical analysis of refractories containing alumina, zirconia, and silica. Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) Wet chemical analysis
SKU/ISBN:9780580585715

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BS EN ISO 21079-3:2008
Chemical analysis of refractories containing alumina, zirconia, and silica. Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) Flame atomic absorption spectrophotometry (FAAS) and inductively c..
SKU/ISBN:9780580585722

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BS ISO 27911:2011
Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
SKU/ISBN:9780580588280

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DD ISO/TS 29041:2008
Gas mixtures. Gravimetric preparation. Mastering correlations in composition
SKU/ISBN:9780580619755

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BS ISO 29081:2010
Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
SKU/ISBN:9780580634789

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BS ISO 11775:2015
Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
SKU/ISBN:9780580668715

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BS ISO 28600:2011
Surface chemical analysis. Data transfer format for scanning-probe microscopy
SKU/ISBN:9780580668777

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BS ISO 13083:2015
Surface chemical analysis. Scanning probe microscopy. Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
SKU/ISBN:9780580677519

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Standards Shop | ICS 71 | ICS 71.040 |  ICS 71.040.40

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