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British Standards for 71.040.40 Chemical analysis | Module: ICS 71.040.40

Standards Shop | ICS 71 | ICS 71.040 |  ICS 71.040.40

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BS ISO 14707:2021
Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
SKU/ISBN:9780539153637

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BS ISO 22581:2021
Surface chemical analysis. Near real-time information from the X-ray photoelectron spectroscopy survey scan. Rules for identification of, and correction for, surface contamination by carbon-containing compounds
SKU/ISBN:9780580994302

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PD ISO/TR 15969:2021
Surface chemical analysis. Depth profiling. Measurement of sputtered depth
SKU/ISBN:9780539154320

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BS ISO 18114:2021
Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials
SKU/ISBN:9780539126808

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BS ISO 19318:2021
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
SKU/ISBN:9780539145342

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PD CEN/TR 17674:2021
Bio-based products. Use of stable isotope ratios of Carbon, Hydrogen, Oxygen and Nitrogen as tools for verification of the origin of bio-based feedstock and characteristics of production processes. Overview of relevant existing applications
SKU/ISBN:9780539145090

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BS ISO 18115-2:2021
Surface chemical analysis. Vocabulary Terms used in scanning-probe microscopy
SKU/ISBN:9780539181982

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BS ISO 17109:2022
Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin films..
SKU/ISBN:9780539191257

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BS ISO 23729:2022
Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
SKU/ISBN:9780539129939

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BS ISO 23170:2022
Surface chemical analysis. Depth profiling. Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
SKU/ISBN:9780539144734

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BS ISO 24417:2022
Surface chemical analysis. Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
SKU/ISBN:9780539120431

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BS ISO 17862:2022
Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
SKU/ISBN:9780539127034

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BS ISO 6142-1:2015+A1:2020
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class I mixtures
SKU/ISBN:9780539138245

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BS ISO 24465:2023
Surface chemical analysis. Determination of the minimum detectability of surface plasmon resonance device
SKU/ISBN:9780539068337

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BS ISO 14606:2022
Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
SKU/ISBN:9780539183597

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BS ISO 18115-1:2023
Surface chemical analysis. Vocabulary General terms and terms used in spectroscopy
SKU/ISBN:9780539168921

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BS EN 17813:2023
Environmental solid matrices. Determination of halogens and sulfur by oxidative pyrohydrolytic combustion followed by ion chromatography
SKU/ISBN:9780539195460

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BS ISO 7431-2:2024
Thiourea for industrial use Specifications
SKU/ISBN:9780539232295

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BS ISO 7431-1:2024
Thiourea for industrial use Test methods
SKU/ISBN:9780539232288

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BS ISO 6142-2:2024
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class II mixtures
SKU/ISBN:9780539181388

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BS ISO 18118:2024
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
SKU/ISBN:9780539236279

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BS ISO 23124:2024
Surface chemical analysis. Measurement of lateral and axial resolutions of a Raman microscope
SKU/ISBN:9780539138610

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BSI Price (PDF/Printed): £150.00
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Standards Shop | ICS 71 | ICS 71.040 |  ICS 71.040.40

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