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PD ISO/TR 22335:2007 | British Standards

Standards Shop | ICS 71 | ICS 71.040 |  ICS 71.040.40

71.040.40 Chemical analysis

Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer

Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer

PD ISO/TR 22335:2007

Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer


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ISBN: 9780580540141

Keywords:
Chemical analysis and testing, X-ray fluorescence spectrometry, Profilometers, Depth, Surface chemistry, Profile measurement, Surface properties, Spectroscopy, Spectrochemical analysis, Electron beams, X-ray analysis, PDF
Publication Date31 Aug 2007
Product SKU30098990
ISBN9780580540141
BSI CodePD ISO/TR 22335:2007
No. of pages28
PublisherBritish Standards Institution
Identical National Standard to:
  • ISO/TR 22335:2007




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