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BS ISO 20263:2024 | British Standards

Standards Shop | ICS 37 |  ICS 37.020

37.020 Optical equipment

Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials

Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials

BS ISO 20263:2024

Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials


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ISBN: 9780539284898

Keywords:
Electron microscopes, Materials by form, Analysis, Interfaces, Measurement, PDF
Publication Date19 Nov 2024
Product SKU30479445
ISBN9780539284898
BSI CodeBS ISO 20263:2024
No. of pages56
ReplacesBS ISO 20263:2017
PublisherBritish Standards Institution
Identical National Standard to:
  • ISO 20263




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