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BS ISO 20263:2017 | British Standards

Standards Shop | ICS 37 |  ICS 37.020

37.020 Optical equipment

Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials

Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials

BS ISO 20263:2017

Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials


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ISBN: 9780580893452

Keywords:
Electron microscopes, Materials by form, Analysis, Interfaces, Measurement, PDF
Publication Date04 Jan 2018
Product SKU30319121
ISBN9780580893452
BSI CodeBS ISO 20263:2017
No. of pages54
PublisherBritish Standards Institution
Identical National Standard to:
  • ISO 20263:2017




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