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BS ISO 17297:2025 | British Standards

Standards Shop | ICS 01 | ICS 01.040 |  ICS 01.040.71

01.040.71 Chemical technology (Vocabularies)

Microbeam analysis. Focused ion beam application for TEM specimen preparation. Vocabulary

Microbeam analysis. Focused ion beam application for TEM specimen preparation. Vocabulary

BS ISO 17297:2025

Microbeam analysis. Focused ion beam application for TEM specimen preparation. Vocabulary


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ISBN: 9780539249811

Keywords:
Common terms, Electric power transmission, Microscope slides, Specimen preparation, Specimens (testing), Electron-beam-deflection tubes, PDF
Publication Date29 May 2025
Product SKU30465998
ISBN9780539249811
BSI CodeBS ISO 17297:2025
No. of pages26
PublisherBritish Standards Institution
Identical National Standard to:
  • ISO 17297




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