Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
BS ISO 16700:2016 - TC
Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
This is a Tracked Changes version
Tracked Changes is a version of a standard that indicates a change has been made, during the standards revision process, between the active standard and its previous version. Additions, deletions, and other formatting and/or content revisions are clearly displayed as underlined and strike through texts, ensuring all changes made between the two documents are quickly and easily identified
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ISBN: 9780539107159
Keywords:
Calibration, Magnification, Electron optics, Electron microscopes, Microscopes, Optical instruments, Scanning electron microscopes, Control samples, Optical phenomena, Accuracy, Electron beams, PDF
| Publication Date | 26 Feb 2020 |
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| Product SKU | 30413322 |
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| ISBN | 9780539107159 |
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| BSI Code | BS ISO 16700:2016 - TC |
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| No. of pages | 58 |
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| Category | Tracked |
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| Publisher | British Standards Institution |
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