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BS ISO 11938:2012 | British Standards

Standards Shop | ICS 71 | ICS 71.040 |  ICS 71.040.50

71.040.50 Physicochemical methods of analysis

Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy

Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy

BS ISO 11938:2012

Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy


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ISBN: 9780580637148

Keywords:
Spectroscopy, X-ray fluorescence spectrometry, Semiconductor diodes, Chemical analysis and testing, Semiconductors, Detectors, Electron beams, PDF
Publication Date30 Apr 2013
Product SKU30185166
ISBN9780580637148
BSI CodeBS ISO 11938:2012
No. of pages22
PublisherBritish Standards Institution
Identical National Standard to:
  • ISO 11938:2012




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