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BS IEC 63011-3:2018 | British Standards

Standards Shop | ICS 31 |  ICS 31.200

31.200 Integrated circuits. Microelectronics

Integrated circuits. Three dimensional integrated circuits Model and measurement conditions of through-silicon via

Integrated circuits. Three dimensional integrated circuits Model and measurement conditions of through-silicon via

BS IEC 63011-3:2018

Integrated circuits. Three dimensional integrated circuits Model and measurement conditions of through-silicon via


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ISBN: 9780580962790

Keywords:
Electromagnetic compatibility, Test equipment, Electrical measurement, Impulse voltages, Impulse-voltage tests, Electronic equipment and components, Semiconductors, Integrated circuits, Transient voltages, PDF
Publication Date24 Jan 2019
Product SKU30350971
ISBN9780580962790
BSI CodeBS IEC 63011-3:2018
No. of pages18
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 63011-3:2018




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