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BS IEC 63003:2015 | British Standards

Standards Shop | ICS 25 | ICS 25.040 |  ICS 25.040.01

25.040.01 Industrial automation systems in general

Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505<sup>TM</sup>

Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505<sup>TM</sup>

BS IEC 63003:2015

Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505TM


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ISBN: 9780580911064

Keywords:
Records (documents), Data processing, Life cycle, Software engineering techniques, Data management, Documents, Information, Process control, Data, Life (durability), Computer software, PDF
Publication Date31 Jan 2016
Product SKU30327705
ISBN9780580911064
BSI CodeBS IEC 63003:2015
No. of pages174
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 63003:2015




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