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BS IEC 62047-49:2025 | British Standards

Standards Shop | ICS 31 |  ICS 31.080

31.080 Semiconductor devices

Semiconductor devices. Micro-electromechanical devices Temperature and humidity test methods for piezoelectric MEMS cantilevers

Semiconductor devices. Micro-electromechanical devices Temperature and humidity test methods for piezoelectric MEMS cantilevers

BS IEC 62047-49:2025

Semiconductor devices. Micro-electromechanical devices Temperature and humidity test methods for piezoelectric MEMS cantilevers


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ISBN: 9780539303728

Keywords:
Semiconductor switches, Semiconductor technology, Electronic devices, Electromechanical devices, Temperature, Humidity, Humidity measurement, Testing methods, Piezoelectric devices, PDF
Publication Date03 Dec 2025
Product SKU30486623
ISBN9780539303728
BSI CodeBS IEC 62047-49:2025
No. of pages14
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 62047-49:2025




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