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BS EN IEC 62132-8:2026 - TC | British Standards

Standards Shop | ICS 31 |  ICS 31.200

31.200 Integrated circuits. Microelectronics

Tracked Changes. Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. IC stripline method

Tracked Changes. Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. IC stripline method

BS EN IEC 62132-8:2026 - TC

Tracked Changes. Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. IC stripline method

This is a Tracked Changes version
Tracked Changes is a version of a standard that indicates a change has been made, during the standards revision process, between the active standard and its previous version. Additions, deletions, and other formatting and/or content revisions are clearly displayed as underlined and strike through texts, ensuring all changes made between the two documents are quickly and easily identified




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ISBN: 9780539418408

Keywords:
Testing conditions, Electrical wave measurement, Electrical measurement, Test equipment, Integrated circuits, Electromagnetic compatibility, Electromagnetic radiation, Electronic equipment and components, PDF
Publication Date15 Apr 2026
Product SKU30559507
ISBN9780539418408
BSI CodeBS EN IEC 62132-8:2026 - TC
No. of pages65
CategoryTracked
PublisherBritish Standards Institution




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