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BS EN 62374-1:2010 | British Standards

Standards Shop | ICS 43 | ICS 43.040 |  ICS 43.040.20

43.040.20 Lighting, signalling and warning devices

Semiconductor devices Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

Semiconductor devices Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

BS EN 62374-1:2010

Semiconductor devices Time-dependent dielectric breakdown (TDDB) test for inter-metal layers


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ISBN: 9780580752063

Keywords:
Electrical measurement, Semiconductors, Dielectric breakdown, Life (durability), Testing conditions, Semiconductor devices, Films (states of matter), PDF
Publication Date30 Jun 2011
Product SKU30245642
ISBN9780580752063
BSI CodeBS EN 62374-1:2010
No. of pages20
CorrectsBS EN 62374-1:2010
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 62374-1:2010/AC:2011
  • IEC 60809:2014/AMD1:2017




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