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BS EN 61967-6:2002+A1:2008 | British Standards

Standards Shop | ICS 31 |  ICS 31.200

31.200 Integrated circuits. Microelectronics

Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. Magnetic probe method

Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. Magnetic probe method

BS EN 61967-6:2002+A1:2008

Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. Magnetic probe method


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ISBN: 9780580729867

Keywords:
Radiofrequencies, Circuits, Electromagnetic tests, Integrated circuits, Emission, Electrical testing, Electromagnetic fields, Radio disturbances, Electronic equipment and components, Noise (spurious signals), Emission measurement, Electromagnetic radiation, PDF
Publication Date31 Dec 2010
Product SKU30235224
ISBN9780580729867
BSI CodeBS EN 61967-6:2002+A1:2008
No. of pages46
CorrectsBS EN 61967-6:2002+A1:2008|BS EN 61967-4:2002
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 61967-6:2002/COR1:2010
  • IEC 61967-6:2002/COR1:2010




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