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BS EN 60749-22:2003 | British Standards

Standards Shop | ICS 29 | ICS 29.100 |  ICS 29.100.10

29.100.10 Magnetic components

Semiconductor devices. Mechanical and climatic test methods Bond strength

Semiconductor devices. Mechanical and climatic test methods Bond strength

BS EN 60749-22:2003

Semiconductor devices. Mechanical and climatic test methods Bond strength


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ISBN: 0580421996

Keywords:
Climate, Bonding, Electronic equipment and components, Environmental testing, Mechanical testing, Integrated circuits, Strength of materials, Semiconductor devices, PDF
Publication Date04 Jul 2003
Product SKU30077148
ISBN0580421996
BSI CodeBS EN 60749-22:2003
No. of pages24
ReplacesBS EN 60749:1999
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 60749-22:2002
  • EN 60749-22:2003
  • IEC 62317-9:2006/AMD1:2007




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