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BS EN 60444-3:1997 | British Standards

Standards Shop | ICS 31 |  ICS 31.140

31.140 Piezoelectric devices

Measurement of quartz crystal unit parameters Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a π-network with compensation of the parallel capacitance C<sub>0</sub>

Measurement of quartz crystal unit parameters Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a π-network with compensation of the parallel capacitance C<sub>0</sub>

BS EN 60444-3:1997

Measurement of quartz crystal unit parameters Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a π-network with compensation of the parallel capacitance C0


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ISBN: 0580224988

Keywords:
Phase measurement (electric), Wave properties and phenomena, Test equipment, Accuracy, Calibration, Frequencies, Circuit networks, Electrical measurement, Resonators, Formulae (mathematics), Electrical wave measurement, Resonance, Resonant frequency, Quartz, Capacitance, Crystal resonators, Inductance, Dielectric devices, Circuits, Piezoelectric devices, PDF
Publication Date15 Sep 1993
Product SKU1204517
ISBN0580224988
BSI CodeBS EN 60444-3:1997
No. of pages20
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 60444-3:1986
  • EN 60444-3:1997




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