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BS ISO 17470:2014 | British Standards

Standards Shop | ICS 71 | ICS 71.040 |  ICS 71.040.99

71.040.99 Other standards related to analytical chemistry

Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

BS ISO 17470:2014

Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry


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ISBN: 9780580841217

Keywords:
Spectrophotometry, Instrumental methods of analysis, Microanalysis, Dispersion (waves), Wavelengths, Chemical analysis and testing, Electron beams, Electron microscopes, Spectroscopy, X-ray fluorescence spectrometry, PDF
Publication Date31 Jan 2014
Product SKU30289032
ISBN9780580841217
BSI CodeBS ISO 17470:2014
No. of pages22
ReplacesBS ISO 17470:2004
PublisherBritish Standards Institution
Identical National Standard to:
  • ISO 17470:2014




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