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BS EN 62417:2010 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.30

31.080.30 Transistors

Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

BS EN 62417:2010

Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)


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ISBN: 9780580586224

Keywords:
Transistors, Metals, Semiconductor devices, Thermal testing, Ions, Semiconductors, Field-effect transistors, Migration (chemical), Electrical measurement, Oxides, PDF
Publication Date30 Jun 2010
Product SKU30163753
ISBN9780580586224
BSI CodeBS EN 62417:2010
No. of pages12
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 62417:2010
  • EN 61192-1:2003
  • IEC 62417:2010




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