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BS EN 62373:2006 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.30

31.080.30 Transistors

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

BS EN 62373:2006

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)


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ISBN: 0580492559

Keywords:
Semiconductors, Semiconductor devices, Testing conditions, Transistors, Metal oxide semiconductors, Temperature, Voltage measurement, Electronic equipment and components, PDF
Publication Date29 Sep 2006
Product SKU30100345
ISBN0580492559
BSI CodeBS EN 62373:2006
No. of pages16
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 62373:2006
  • IEC 62373:2006
  • EN 50289-3-7:2001




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