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BS EN 62047-25:2016 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.99

31.080.99 Other semiconductor devices

Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of pull-press and shearing strength of micro bonding area

Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of pull-press and shearing strength of micro bonding area

BS EN 62047-25:2016

Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of pull-press and shearing strength of micro bonding area


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ISBN: 9780580856150

Keywords:
Semiconductor technology, Integrated circuits, Electronic equipment and components, Resonance, Electromechanical devices, Thin-film devices, Bend testing, Vibration, Test specimens, Fatigue testing, Test equipment, Semiconductor devices, PDF
Publication Date30 Nov 2016
Product SKU30296141
ISBN9780580856150
BSI CodeBS EN 62047-25:2016
No. of pages28
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 62047-25:2016
  • EN 60745-2-8:2003/A11:2007
  • EN 62047-25:2016




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